• ISSN: 2301-3567 (Print), 2972-3981 (Online)
    • Abbreviated Title: J. Econ. Bus. Manag.
    • Frequency: Quarterly
    • DOI: 10.18178/JOEBM
    • Editor-in-Chief: Prof. Eunjin Hwang
    • Executive Editor: Ms. Fiona Chu
    • Abstracting/ Indexing:  CNKIGoogle ScholarCrossref
    • E-mail: joebm.editor@gmail.com
JOEBM 2017 Vol.5(8): 298-303 ISSN: 2301-3567
DOI: 10.18178/joebm.2017.5.8.529

Measurement Method and Application Study on Technological Linkage Oriented to Patent Early-warning

Mier Zhang, Haipeng Li, and Wei Guo

Abstract— Technological conflicts and patent litigations have increased rapidly in recent years. Patent early-warning is an important method to coping with the situation. The extension of technological linkage is major inducer of patent litigation. The study on technological linkage has contributed to conduct patent early-warning. The correlation between patent citations and technological linkage has been analyzed. Technological linkage index is constructed based on patent multi-stage citations and a quantitative method of measuring technological linkage between patent holders is proposed. Taking Apple and Samsung as research samples, the measurement method is applied. The result of time series analysis shows that technological linkage index between them has increased rapidly and this trend keeps ahead of the emergence of patent litigations. Technological linkage index can be employed to analyze and pre-alert for potential patent litigations between specific patent holders.

Index Terms— Patent citation, patent early-warning, patent litigation, technological linkage.

Mier Zhang, Haipeng Li and Wei Guo are with Faculty of Management and Economics, Dalian University of Technology, Dalian, Liaoning 116023 China (e-mail: ZHMILL@dlut.edu.cn)


Cite: Mier Zhang, Haipeng Li, and Wei Guo, " Measurement Method and Application Study on Technological Linkage Oriented to Patent Early-warning," Journal of Economics, Business and Management vol. 5, no. 8, pp. 298-303, 2017.

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